Atomic Force Microscopy (AFM)

Model：

DimensionICON, BRUKER ICON3000

Classification：

Surface/MorphologyAnalysis, Material Physical and Chemical Test, Pilot Test Verification, All

Classification：

Battery Electrodes & Cells/Material Physical and Chemical Testing/Surface/Morphology Analysis/All

Model：

Dimension ICON、BRUKER ICON3000

Details

Overview

Details

This product is designed for high-resolution surface characterization in advanced materials and battery research. As a versatile atomic force microscope available in Dimension ICON and BRUKER ICON3000 configurations, it enables nanoscale imaging of electrode surfaces, coatings, and separators. Key capabilities include measuring surface roughness, morphology, and mechanical properties like adhesion or stiffness, which are critical for evaluating electrode degradation and interface stability during cycling. The system supports both ambient and controlled-environment operation, making it suitable for in situ studies of battery materials. Common applications include analyzing SEI layer formation, cathode particle cracking, and coating uniformity. Its combination of high spatial resolution and advanced feedback control ensures reliable data for correlating surface features with electrochemical performance, aiding the development of longer-life and higher-energy-density energy storage systems.