Industrial Computed Tomography (CT)

Model：

GEPhoenix v | tome | x S 240

Classification：

surface/morphologyanalysis, material physical and chemical testing, pilot test verification, all

Classification：

Battery Electrodes & Cells/Material Physical and Chemical Testing/Surface/Morphology Analysis/All

Model：

GE Phoenix v | tome | x S 240

Details

Overview

Details

This industrial computed tomography system, the GE Phoenix v|tome|x S 240, is designed for high-resolution, non-destructive internal structure analysis of battery electrodes, cells, and advanced materials. It combines microfocus X-ray technology with a 240 kV source, enabling detailed 3D imaging of complex geometries and density variations. The system supports both physical and chemical material testing, as well as surface and morphology assessment, making it particularly relevant for evaluating electrode porosity, coating uniformity, and interfacial integrity in lithium-ion and next-generation batteries. Typical use scenarios include quality control of cell components, defect detection (e.g., cracks, delamination), and research into degradation mechanisms. Its dual-tube configuration allows flexible scanning of small to medium samples, providing reliable volumetric data without sample destruction.